109 lines
4.5 KiB
C#
109 lines
4.5 KiB
C#
using MainShell.Common.Extension;
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using MainShell.DeviceMaintance.Model;
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using MainShell.Hardware;
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using MainShell.Parameter;
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using MainShell.Recipe.Models;
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using MaxwellFramework.Core.Interfaces;
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using MwFramework.Device;
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using MwFramework.ManagerService;
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using MXJM.Parameter.Maintance;
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using System;
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using System.Collections.Generic;
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using System.Linq;
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using System.Text;
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using System.Threading.Tasks;
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namespace MainShell.HeightMeasure.Model
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{
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public class DiastimeterHeightMeasure : IHeightMeasure
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{
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public HeightBaseItem HeightBaseItem { get; set; }
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public DiaHeightItem DiaHeightItem { get; set; }
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public CapHeightItem CapHeightItem { get; set; }
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private HardwareManager _hardwareManager;
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private readonly IDiastimeter _diastimeter;
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private readonly IParamList _paramlist;
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public DiastimeterHeightMeasure(GlobalParameterContext globalParam, HardwareManager hardwareManager, IParameterManager paramList)
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{
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_hardwareManager = hardwareManager;
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_diastimeter = _hardwareManager.Diastimeter;
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_paramlist = paramList as IParamList;
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DiaHeightItem = globalParam.HeightBaseSetting.DiaHeightItem;
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HeightBaseItem = globalParam.HeightBaseSetting.HeightBaseItem;
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}
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public double GetDistance()
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{
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_hardwareManager.Diastimeter.GetLastSamples(out double Distance);
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if (double.IsNaN(Distance))
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{
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throw new Exception("测距仪反馈数据为NAN，请检查测距仪状态");
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}
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return Distance;
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}
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public void CalculateHeight()
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{
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double glassHeightAverage = HeightBaseItem.GlassHeightMeasureList.Average(m => m.Height);
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double glassZAverage = HeightBaseItem.GlassHeightMeasureList.Average(m => m.Z);
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double waferHeightAverage = HeightBaseItem.WaferHeightMeasureList.Average(m => m.Height);
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double waferZAverage = HeightBaseItem.WaferHeightMeasureList.Average(m => m.Z);
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HeightBaseItem.GlassZHeight = glassZAverage + glassHeightAverage;
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HeightBaseItem.WaferZHeight = waferZAverage + waferHeightAverage;
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if (_paramlist == null)
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{
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throw new InvalidOperationException("IParamList 未初始化，无法计算测高标定参数。");
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}
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var needleZCalibrationItem = _paramlist.GetParameter<NeedleCalibrationSetting>().NeedleZCalibrationItem;
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DiaHeightItem.NeedleTouchHeight = needleZCalibrationItem.NeedleTouchHeight;
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DiaHeightItem.KnifeOffset = needleZCalibrationItem.KnifeOffset;
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//Gap2
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HeightBaseItem.FromDieToPadDistance = GetGap2(HeightBaseItem.DieThickness, HeightBaseItem.WaferFilmThickness);
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//激光与刺晶头偏差
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DiaHeightItem.LaserToZ1Offset = DiaHeightItem.NeedleTouchHeight -
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(DiaHeightItem.CaliZHeightLaserReading + DiaHeightItem.CaliZHeightPositionZ) + DiaHeightItem.KnifeOffset;
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//刺晶头接触到方片高度
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HeightBaseItem.NeedleTouchWaferZHeight = HeightBaseItem.WaferZHeight + DiaHeightItem.LaserToZ1Offset;
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}
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public double GetGap2(double dieThickness, double waferFilmThickness)
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{
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double height = 0.0;
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height = HeightBaseItem.WaferZHeight - HeightBaseItem.GlassZHeight
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- dieThickness - waferFilmThickness;
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return Math.Abs(height);
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}
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//public double GetZStageTheoryWorkHeight(double glassThickness, double carrierThickness, WaferRecipeContentItem currentWaferRecipe = null)
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//{
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// double calibWaferToStageDis = HeightBaseItem.WaferFilmThickness + HeightBaseItem.DieThickness +
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// HeightBaseItem.FromDieToPadDistance + HeightBaseItem.GlassThickness + HeightBaseItem.CarrierThickness;
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// double actualWaferToStageDis = currentWaferRecipe.WaferFilmThickness + currentWaferRecipe.DieThickness +
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// currentWaferRecipe.FromDieToPadDistance + glassThickness + carrierThickness;
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// double height = HeightBaseItem.StageDatumHeight + calibWaferToStageDis - actualWaferToStageDis;
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// return height;
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//}
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//public double GetZ1WorkHeight(BondingCraftRecipeContentItem currentWaferRecipe = null)
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//{
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// double height = 0.0;
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// //2.针尖的工作高度
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// height = HeightBaseItem.NeedleTouchWaferZHeight + currentWaferRecipe.Gap1;
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// return height;
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//}
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}
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}
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