using MainShell.Recipe.Models; using MainShell.Models.Wafer; using System; using System.Collections.Generic; using System.Threading; using System.Windows; namespace MainShell.Process { public class WaferDiePositionContext { public WaferDiePositionContext() { CaptureFrames = new List(); FrameResults = new List(); MapDies = new Die[0, 0]; PatchDies = new List(); ExceptDies = new List(); } public string WorkflowName { get; set; } public string RecipeName { get; set; } public WaferRecipe WaferRecipe { get; set; } public WaferScanSettings ScanSettings { get; set; } public int RowCount { get; set; } public int ColumnCount { get; set; } public double PitchX { get; set; } public double PitchY { get; set; } public WaferScanArea ScanArea { get; set; } public CancellationToken CancellationToken { get; set; } public List CaptureFrames { get; set; } public List FrameResults { get; set; } public WaferRecognitionSnapshot RecognitionSnapshot { get; set; } public WaferScanExecutionSummary ExecutionSummary { get; set; } public bool IsManualMode { get; set; } public bool IsVisionCheckMode { get; set; } public string ErrorMessage { get; set; } public string OutputDirectory { get; set; } public WaferScanPlan ScanPlan { get; set; } public double MapAngleThreshold { get; set; } public double MapRotateAngle { get; set; } public double MapDistanceThreshold { get; set; } public Die[,] MapDies { get; set; } public List PatchDies { get; set; } public List ExceptDies { get; set; } } }