添加 MX-PD-盘古 项目文件
将 MX-PD-盘古 - new 目录下的所有文件添加到主仓库
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Shi.Ji
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using MaxwellFramework.Core.Attributes;
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using System;
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using MainShell.Common;
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using MainShell.Recipe.Models;
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using System.Collections.Generic;
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using System.Globalization;
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using System.Linq;
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using System.Windows;
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namespace MainShell.Process
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{
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[Singleton]
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public class WaferScanPlanner : IWaferScanPlanner
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{
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private readonly IWaferMachineAdapter _waferMachineAdapter;
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public WaferScanPlanner(IWaferMachineAdapter waferMachineAdapter)
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{
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_waferMachineAdapter = waferMachineAdapter ?? throw new ArgumentNullException(nameof(waferMachineAdapter));
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}
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public WaferScanPlan CreatePlan(WaferDiePositionContext context)
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{
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if (context == null)
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{
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throw new ArgumentNullException(nameof(context));
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}
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WaferScanSettings scanSettings = context.ScanSettings ?? throw new InvalidOperationException("DiePosition: scan settings are required for scan planning.");
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Point cameraFieldOfView = _waferMachineAdapter.GetCameraFieldOfView(context);
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ValidateCameraFieldOfView(cameraFieldOfView);
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WaferScanArea scanArea = BuildScanArea(context, scanSettings, cameraFieldOfView);
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double stepX = CalculateStep(cameraFieldOfView.X, scanSettings.OverlapRateX);
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double stepY = CalculateStep(cameraFieldOfView.Y, scanSettings.OverlapRateY);
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int scanColumnCount = CalculateScanCount(scanArea.WaferWidth, cameraFieldOfView.X, stepX);
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int scanRowCount = CalculateScanCount(scanArea.WaferHeight, cameraFieldOfView.Y, stepY);
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List<Point> rawPathPoints = BuildRawPathPoints(scanArea, scanSettings, stepX, stepY, scanColumnCount, scanRowCount);
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List<WaferPlannerPointAdjustment> adjustments = new List<WaferPlannerPointAdjustment>();
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List<Point> finalPathPoints = BuildAdjustedPathPoints(rawPathPoints, context, scanSettings, adjustments);
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Point startPoint = finalPathPoints.Count > 0 ? finalPathPoints[0] : scanArea.StartPoint;
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Point endPoint = finalPathPoints.Count > 0 ? finalPathPoints[finalPathPoints.Count - 1] : scanArea.EndPoint;
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WaferScanPlan scanPlan = new WaferScanPlan();
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scanPlan.ScanRowCount = scanRowCount;
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scanPlan.ScanColumnCount = scanColumnCount;
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scanPlan.PathPoints = finalPathPoints;
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scanPlan.RawPathPoints = rawPathPoints;
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scanPlan.FinalPathPoints = finalPathPoints;
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scanPlan.ScanArea = scanArea;
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scanPlan.StartPoint = startPoint;
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scanPlan.EndPoint = endPoint;
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scanPlan.StepX = stepX;
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scanPlan.StepY = stepY;
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scanPlan.OverlapX = NormalizeOverlap(scanSettings.OverlapRateX);
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scanPlan.OverlapY = NormalizeOverlap(scanSettings.OverlapRateY);
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scanPlan.Adjustments = adjustments;
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scanPlan.PathGenerationMessage = string.Format(
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CultureInfo.InvariantCulture,
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"DiePosition: generated serpentine scan plan with {0} points ({1}x{2}), stepX={3:F3}, stepY={4:F3}, adjusted={5}.",
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scanPlan.PathPointCount,
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scanColumnCount,
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scanRowCount,
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stepX,
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stepY,
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adjustments.Count(x => x.WasAdjusted));
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scanPlan.SoftLimitAdjustedCount = adjustments.Count(x => x.WasAdjusted);
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scanPlan.AddedCoveragePointCount = 0;
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context.ScanArea = scanArea;
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return scanPlan;
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}
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private static void ValidateCameraFieldOfView(Point cameraFieldOfView)
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{
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if (cameraFieldOfView.X <= 0d || cameraFieldOfView.Y <= 0d)
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{
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throw new InvalidOperationException("DiePosition: camera field of view must be greater than zero.");
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}
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}
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private static WaferScanArea BuildScanArea(WaferDiePositionContext context, WaferScanSettings scanSettings, Point cameraFieldOfView)
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{
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double waferWidth = context.WaferRecipe != null && context.WaferRecipe.WaferInfo != null ? context.WaferRecipe.WaferInfo.WaferWidth : 0d;
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double waferHeight = context.WaferRecipe != null && context.WaferRecipe.WaferInfo != null ? context.WaferRecipe.WaferInfo.WaferHeight : 0d;
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double effectiveWaferWidth = Math.Max(cameraFieldOfView.X, waferWidth);
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double effectiveWaferHeight = Math.Max(cameraFieldOfView.Y, waferHeight);
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double endX = scanSettings.StartPointX + ResolveDirectionSign(scanSettings.ScanDirectionX) * Math.Max(0d, effectiveWaferWidth - cameraFieldOfView.X);
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double endY = scanSettings.StartPointY + ResolveDirectionSign(scanSettings.ScanDirectionY) * Math.Max(0d, effectiveWaferHeight - cameraFieldOfView.Y);
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WaferScanArea scanArea = new WaferScanArea();
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scanArea.StartPoint = new Point(scanSettings.StartPointX, scanSettings.StartPointY);
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scanArea.EndPoint = new Point(endX, endY);
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scanArea.MinX = Math.Min(scanArea.StartPoint.X, scanArea.EndPoint.X);
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scanArea.MaxX = Math.Max(scanArea.StartPoint.X, scanArea.EndPoint.X);
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scanArea.MinY = Math.Min(scanArea.StartPoint.Y, scanArea.EndPoint.Y);
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scanArea.MaxY = Math.Max(scanArea.StartPoint.Y, scanArea.EndPoint.Y);
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scanArea.WaferWidth = effectiveWaferWidth;
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scanArea.WaferHeight = effectiveWaferHeight;
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return scanArea;
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}
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private static double CalculateStep(double fov, double overlapRate)
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{
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double normalizedOverlap = NormalizeOverlap(overlapRate);
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double step = fov * (1d - normalizedOverlap);
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if (step <= 0d)
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{
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return fov;
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}
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return step;
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}
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private static double NormalizeOverlap(double overlapRate)
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{
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if (overlapRate < 0d)
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{
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return 0d;
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}
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if (overlapRate >= 1d)
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{
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return 0.95d;
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}
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return overlapRate;
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}
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private static int CalculateScanCount(double waferSpan, double fov, double step)
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{
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if (waferSpan <= fov)
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{
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return 1;
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}
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return (int)Math.Ceiling((waferSpan - fov) / step) + 1;
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}
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private static List<Point> BuildRawPathPoints(WaferScanArea scanArea, WaferScanSettings scanSettings, double stepX, double stepY, int scanColumnCount, int scanRowCount)
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{
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List<Point> rawPathPoints = new List<Point>();
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int directionX = ResolveDirectionSign(scanSettings.ScanDirectionX);
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int directionY = ResolveDirectionSign(scanSettings.ScanDirectionY);
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for (int rowIndex = 0; rowIndex < scanRowCount; rowIndex++)
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{
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double y = scanArea.StartPoint.Y + rowIndex * stepY * directionY;
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bool reverseColumns = rowIndex % 2 == 1;
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for (int columnIndex = 0; columnIndex < scanColumnCount; columnIndex++)
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{
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int serpentineColumnIndex = reverseColumns ? (scanColumnCount - 1 - columnIndex) : columnIndex;
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double x = scanArea.StartPoint.X + serpentineColumnIndex * stepX * directionX;
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rawPathPoints.Add(new Point(x, y));
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}
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}
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return rawPathPoints;
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}
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private List<Point> BuildAdjustedPathPoints(List<Point> rawPathPoints, WaferDiePositionContext context, WaferScanSettings scanSettings, List<WaferPlannerPointAdjustment> adjustments)
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{
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List<Point> adjustedPathPoints = new List<Point>();
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foreach (Point rawPathPoint in rawPathPoints)
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{
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Point adjustedPoint = _waferMachineAdapter.AdjustPointWithinSoftLimit(
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rawPathPoint,
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context,
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scanSettings.SoftLimitOffsetMm,
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out bool adjusted,
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out string reason);
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WaferPlannerPointAdjustment adjustment = new WaferPlannerPointAdjustment();
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adjustment.OriginalPoint = rawPathPoint;
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adjustment.AdjustedPoint = adjustedPoint;
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adjustment.WasAdjusted = adjusted;
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adjustment.Reason = reason;
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adjustments.Add(adjustment);
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adjustedPathPoints.Add(adjustedPoint);
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}
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return adjustedPathPoints;
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}
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private static int ResolveDirectionSign(TransPathDirection direction)
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{
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return direction == TransPathDirection.Negative ? -1 : 1;
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}
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}
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}
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